• DocumentCode
    2615552
  • Title

    Ranking and selection techniques with overlapping variance estimators

  • Author

    Healey, Christopher ; Goldsman, David ; Kim, Seong-Hee

  • Author_Institution
    Georgia Inst. of Technol., Atlanta
  • fYear
    2007
  • fDate
    9-12 Dec. 2007
  • Firstpage
    522
  • Lastpage
    529
  • Abstract
    Some ranking and selection (R&S) procedures for steady- state simulation require an estimate of the asymptotic variance parameter of each system to guarantee a certain probability of correct selection. We show that the performance of such R&S procedures depends on the quality of the variance estimates that are used. In this paper, we study the performance of R&S procedures with two new variance estimators -overlapping area and overlapping Cramer-von Mises estimators- which show better long-run performance than other estimators previously used in R&S problems.
  • Keywords
    parameter estimation; probability; simulation; asymptotic variance parameter estimation; overlapping variance estimator; probability; ranking technique; selection technique; steady-state simulation; Convergence; Modeling; Parameter estimation; Personal communication networks; Sociotechnical systems; Steady-state; Systems engineering and theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference, 2007 Winter
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-1306-5
  • Electronic_ISBN
    978-1-4244-1306-5
  • Type

    conf

  • DOI
    10.1109/WSC.2007.4419643
  • Filename
    4419643