DocumentCode
2615552
Title
Ranking and selection techniques with overlapping variance estimators
Author
Healey, Christopher ; Goldsman, David ; Kim, Seong-Hee
Author_Institution
Georgia Inst. of Technol., Atlanta
fYear
2007
fDate
9-12 Dec. 2007
Firstpage
522
Lastpage
529
Abstract
Some ranking and selection (R&S) procedures for steady- state simulation require an estimate of the asymptotic variance parameter of each system to guarantee a certain probability of correct selection. We show that the performance of such R&S procedures depends on the quality of the variance estimates that are used. In this paper, we study the performance of R&S procedures with two new variance estimators -overlapping area and overlapping Cramer-von Mises estimators- which show better long-run performance than other estimators previously used in R&S problems.
Keywords
parameter estimation; probability; simulation; asymptotic variance parameter estimation; overlapping variance estimator; probability; ranking technique; selection technique; steady-state simulation; Convergence; Modeling; Parameter estimation; Personal communication networks; Sociotechnical systems; Steady-state; Systems engineering and theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation Conference, 2007 Winter
Conference_Location
Washington, DC
Print_ISBN
978-1-4244-1306-5
Electronic_ISBN
978-1-4244-1306-5
Type
conf
DOI
10.1109/WSC.2007.4419643
Filename
4419643
Link To Document