• DocumentCode
    2616667
  • Title

    Advances in silicon carbide (SiC) device processing and substrate fabrication for high power microwave and high temperature electronics

  • Author

    Driver, M.C. ; Hopkins, R.H. ; Brandt, C.D. ; Barrett, D.L. ; Burk, A.A. ; Clarke, R.C. ; Eldridge, G.W. ; Hobgood, H.M. ; McHugh, J.P. ; McMullin, P.G. ; Siergiej, R.R. ; Sriram, S.

  • Author_Institution
    Westinghouse Sci. & Technol. Center, Pittsburgh, PA, USA
  • fYear
    1993
  • fDate
    10-13 Oct. 1993
  • Firstpage
    19
  • Lastpage
    21
  • Abstract
    High-power density, temperature tolerant silicon carbide (SiC) electronics offer an exceptional opportunity to increase the performance and lower the cost of many existing and emerging military and commercial products. Surveillance and tactical radar systems, compact electric tank and aircraft engine controls, high reliability aviation electronics, and radiation resistance satellite components are some examples. Recent technology advances have brought this potential payoff closer to reality. These include the fabrication of a record-setting MESFET device with 12 dB gain at 2 GHz and 2 W/mm of power at 1 GHz and the world´s first 2-inch diameter high-resistivity SiC wafers for planar devices and low resistivity substrates for power devices. Vertical transistor structures have also been fabricated using both Schottky barrier and MOS gates.<>
  • Keywords
    crystal growth from vapour; electron beam lithography; microwave field effect transistors; microwave power transistors; polishing; power MESFET; power MOSFET; power field effect transistors; semiconductor growth; semiconductor materials; silicon compounds; static induction transistors; substrates; 1 GHz; 12 dB; 2 GHz; 2 in; MESFET device; MOS gates; Schottky barrier; SiC device processing; electron beam direct write processing; high power microwave electronics; high temperature electronics; high-resistivity; low resistivity substrates; material technology; planar devices; static induction transistor; substrate fabrication; temperature tolerant; vapour transport; vertical MOSFET; vertical transistor structures; wafer polishing; Aerospace electronics; Airborne radar; Aircraft propulsion; Control systems; Costs; Military aircraft; Silicon carbide; Spaceborne radar; Surveillance; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1993. Technical Digest 1993., 15th Annual
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    0-7803-1393-3
  • Type

    conf

  • DOI
    10.1109/GAAS.1993.394508
  • Filename
    394508