Title :
Electrical characterization of packaging environment using switching noise generating vehicle
Author :
Sudo, T. ; Miura, M. ; Hirano, N. ; Hiruta, Y.
Author_Institution :
Semicond. Dev. Eng. LAb., Toshiba Corp., Kawasaki, Japan
Abstract :
A CMOS test vehicle which generates simultaneous switching noise programmably is described. It is effective to evaluate noise level under a practical packaging environment, such as single-chip packages or multichip modules in any power/ground structures. Measured data can be used to verify the effective inductance of the package electrical model
Keywords :
CMOS digital integrated circuits; circuit analysis computing; inductance; integrated circuit modelling; integrated circuit noise; integrated circuit packaging; noise generators; CMOS test vehicle; effective inductance; electrical characterisation; multichip modules; package electrical model; packaging environment; power/ground structures; simultaneous switching noise; single-chip packages; switching noise generating vehicle; Electric variables measurement; Inductance measurement; Multichip modules; Noise generators; Noise level; Packaging; Semiconductor device modeling; Testing; Vehicles; Working environment noise;
Conference_Titel :
Electrical Performance of Electronic Packaging, 1993
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-1427-1
DOI :
10.1109/EPEP.1993.394551
