A frequency domain sensitivity analysis of closed-loop multiconductor transmission lines

Author

Rahal-Arabi, Tawfik ; Suarez-Gartner, Ricardo ; Rausch, Martin ; Lape, Kristine M.

Author_Institution

Intel Corp., Hilsboro, OR, USA

fYear

1993

fDate

20-22 Oct 1993

Firstpage

193

Lastpage

195

Abstract

A frequency domain technique for the optimization, sensitivity, and robustness analysis of a large high-speed lossy multiconductor transmission line networks in VLSI regimes is presented. The technique is used to demonstrate the superiority of closed-loop topologies in terms of their electrical performance. To demonstrate this superiority, the numerical frequency domain results are validated by independent time domain simulations and measurements

Keywords

VLSI; circuit analysis computing; circuit optimisation; frequency-domain analysis; integrated circuit interconnections; integrated circuit packaging; network topology; sensitivity analysis; transmission line theory; VLSI; closed-loop multiconductor transmission lines; closed-loop topologies; electrical performance; frequency domain sensitivity analysis; interconnect topology; lossy network; numerical analysis; optimization; robustness; time domain simulations; Frequency domain analysis; Frequency measurement; Multiconductor transmission lines; Network topology; Propagation losses; Robustness; Sensitivity analysis; Time measurement; Transmission line measurements; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Performance of Electronic Packaging, 1993

Conference_Location

Monterey, CA

Print_ISBN

0-7803-1427-1

Type

conf

DOI

10.1109/EPEP.1993.394556

Filename

394556