Title :
Automatic Test Data Generation for Path Testing Using Genetic Algorithms
Author :
Xibo, Wang ; Na, Su
Author_Institution :
Shenyang Univ. of Technol., Shenyang, China
Abstract :
Software testing is the important means that guarantee software quality and reliability. Improving the automation ability of software testing is very important for ensuring software´s quality and reducing development cost, and improving the automation ability of test cases generation is the key point for the entire process. This paper discusses the methods and techniques of genetic algorithm as the key algorithm to automatically generating the test data, and elaborates some specific problems need to solve in realization process: such as coding, the selection of fitness function and the improvement of hereditary operator, etc.
Keywords :
automatic test pattern generation; genetic algorithms; program testing; automatic test data generation; genetic algorithms; path testing; software testing; Algorithm design and analysis; Data models; Instruments; Optimization; Software algorithms; Software testing; Automatic Test Data; Branch-Cover; Genetic Algorithm; Path Testing;
Conference_Titel :
Measuring Technology and Mechatronics Automation (ICMTMA), 2011 Third International Conference on
Conference_Location :
Shangshai
Print_ISBN :
978-1-4244-9010-3
DOI :
10.1109/ICMTMA.2011.152