Jitter-improved sampling in micro-CT

Longitudinal sampling in CT in general and in circular cone-beam CT in particular is problematic because there is no source or detector motion in the direction of the z-axis. The projection of one object point onto the detector therefore shows little longitudinal variation during one rotation. For object points that are close to the rotation axis it may happen that their projection onto the detector varies by less than one detector row during one rotation. In this case, the object point is longitudinally undersampled.