• DocumentCode
    2617431
  • Title

    Code-coverage Based Test Vector Generation for SystemC Designs

  • Author

    Dias Junior, Alair ; Da Silva, Diogenes Cecilio, Jr.

  • Author_Institution
    Dept. de Engenharia Eletronica, Univ. Fed. de Minas Gerais, Belo Horizonte
  • fYear
    2007
  • fDate
    9-11 March 2007
  • Firstpage
    198
  • Lastpage
    206
  • Abstract
    This work presents a methodology for the automatic test vector generation for SystemC combinational designs based on code coverage analysis which is complementary to the functional testing. The method uses coverage information to generate test vectors capable of covering the portions of code not exercised by the black-box testing. Vectors are generated using an instrumented code followed by a numerical optimization method. This approach does not suffer from restrictions related to symbolic execution such as defining array reference values and loop boundaries, as the code is really executed together with the optimization. We expect this combined methodology to achieve total code coverage of the design and reduce the fault of omission problem, undetectable by structural testing alone.
  • Keywords
    automatic test pattern generation; circuit CAD; combinational circuits; system-on-chip; SystemC combinational designs; automatic test vector generation; black-box testing; functional testing; numerical optimization; structural testing; Automata; Automatic testing; Encoding; Formal verification; Instruments; Optimization methods; Process design; Productivity; System testing; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI, 2007. ISVLSI '07. IEEE Computer Society Annual Symposium on
  • Conference_Location
    Porto Alegre
  • Print_ISBN
    0-7695-2896-1
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2007.31
  • Filename
    4208916