DocumentCode :
2617431
Title :
Code-coverage Based Test Vector Generation for SystemC Designs
Author :
Dias Junior, Alair ; Da Silva, Diogenes Cecilio, Jr.
Author_Institution :
Dept. de Engenharia Eletronica, Univ. Fed. de Minas Gerais, Belo Horizonte
fYear :
2007
fDate :
9-11 March 2007
Firstpage :
198
Lastpage :
206
Abstract :
This work presents a methodology for the automatic test vector generation for SystemC combinational designs based on code coverage analysis which is complementary to the functional testing. The method uses coverage information to generate test vectors capable of covering the portions of code not exercised by the black-box testing. Vectors are generated using an instrumented code followed by a numerical optimization method. This approach does not suffer from restrictions related to symbolic execution such as defining array reference values and loop boundaries, as the code is really executed together with the optimization. We expect this combined methodology to achieve total code coverage of the design and reduce the fault of omission problem, undetectable by structural testing alone.
Keywords :
automatic test pattern generation; circuit CAD; combinational circuits; system-on-chip; SystemC combinational designs; automatic test vector generation; black-box testing; functional testing; numerical optimization; structural testing; Automata; Automatic testing; Encoding; Formal verification; Instruments; Optimization methods; Process design; Productivity; System testing; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI, 2007. ISVLSI '07. IEEE Computer Society Annual Symposium on
Conference_Location :
Porto Alegre
Print_ISBN :
0-7695-2896-1
Type :
conf
DOI :
10.1109/ISVLSI.2007.31
Filename :
4208916
Link To Document :
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