Title :
Enhancing the Tolerance to Power-Supply Instability in Digital Circuits
Author :
Semião, J. ; Freijedo, J. ; Andina, J. J Rodríguez ; Vargas, F. ; Santos, M.B. ; Teixeira, I.C. ; Teixeira, J.P.
Author_Institution :
Algarve Univ., Faro
Abstract :
As IC technology scales down, power supply instability may dramatically contribute to signal integrity loss. In this paper, the authors propose a new methodology to enhance circuit tolerance to power-supply voltage (VDD1) local variations, without degrading its performance. The underlying idea is to add additional tolerance to the edge trigger of the clock signal driving specific memory cells. The clock duty-cycle (CDC) is thus dynamically modulated according to VDD. Two architectures are presented, and one of them is shown to be effective. The key module is a clock stretching logic (CSL) block, used to increase CDC according to VDD-VSS variations. Moreover, when clock frequency reduction is inevitable, circuit tolerance when disturbances start to occur is enhanced, allowing the clock generator to react and reduce its frequency. Experimental results based on SPICE simulations for simple combinational, pipeline and finite-state machine (FSM) circuits are used to demonstrate the usefulness of the proposed methodology.
Keywords :
clocks; combinational circuits; digital integrated circuits; finite state machines; power supply quality; stability; system-on-chip; clock duty-cycle; clock frequency reduction; clock generator; clock skew; clock stretching logic block; combinational; digital circuits; finite-state machine; memory cells; pipeline circuits; power supply instability; signal integrity loss; system-on-chip; Circuit simulation; Clocks; Degradation; Digital circuits; Frequency; Logic; Pipelines; Power supplies; SPICE; Voltage;
Conference_Titel :
VLSI, 2007. ISVLSI '07. IEEE Computer Society Annual Symposium on
Conference_Location :
Porto Alegre
Print_ISBN :
0-7695-2896-1
DOI :
10.1109/ISVLSI.2007.44