DocumentCode :
26178
Title :
Single-Flange 2-Port TRL Calibration for Accurate THz 
-Parameter Measurements of Waveguide Integrated Circuits
Author :
Hanning, Johanna ; Stenarson, J. ; Yhland, K. ; Sobis, Peter J. ; Bryllert, Tomas ; Stake, Jan
Author_Institution :
Dept. of Microtechnol. & Nanosci.-MC2, Chalmers Univ. of Technol., Göteborg, Sweden
Volume :
4
Issue :
5
fYear :
2014
fDate :
Sept. 2014
Firstpage :
582
Lastpage :
587
Abstract :
This paper describes a single flange 2-port measurement setup for S-parameter characterization of waveguide integrated devices. The setup greatly reduces calibration and measurement uncertainty by eliminating vector network analyzer (VNA) extender cable movement and minimizing the effect of waveguide manufacturing tolerances. Change time of standards is also improved, reducing the influence of VNA drift on the uncertainty. A TRL calibration kit has been manufactured and measurements are demonstrated in WR-03 (220-325 GHz).
Keywords :
S-parameters; calibration; measurement uncertainty; microwave integrated circuits; network analysers; substrate integrated waveguides; S-parameter characterization; TRL calibration kit; VNA drift; VNA extender cable movement; WR-03; frequency 220 GHz to 325 GHz; measurement uncertainty; single flange 2-port measurement setup; vector network analyzer extender cable movement; waveguide integrated circuits; waveguide manufacturing tolerances; Calibration; Educational institutions; Microwave circuits; Standards; Uncertainty; ${rm S}$
fLanguage :
English
Journal_Title :
Terahertz Science and Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-342X
Type :
jour
DOI :
10.1109/TTHZ.2014.2342497
Filename :
6877746
Link To Document :
