• DocumentCode
    2618041
  • Title

    Application of combined discrete-event simulation and optimization models in semiconductor enterprise manufacturing systems

  • Author

    Godding, Gary ; Sarjoughian, Hessam ; Kempf, Karl

  • Author_Institution
    Arizona State Univ., Tempe
  • fYear
    2007
  • fDate
    9-12 Dec. 2007
  • Firstpage
    1729
  • Lastpage
    1736
  • Abstract
    It is a common practice to use simulation for validating different types of control and planning algorithms. However, the science of how to rigorously integrate simulation and decision models is not well understood and becomes critically important as the complexity and scale of these models increase. In our research, we have developed a methodology for integrating different types of models using a Knowledge Interchange Broker (KIB). In this paper we describe a supply-chain semiconductor application where the KIB has been used as an integral part of developing and deploying a commercial Model Predictive Control model for use in operating a multi-billion dollar supply chain. The simulation based experiments facilitated developing and validating the controller design and data automation for a real-world semiconductor manufacturing system.
  • Keywords
    control system synthesis; discrete event simulation; optimisation; predictive control; semiconductor device manufacture; supply chain management; controller design; data automation; discrete-event simulation; knowledge interchange broker; model predictive control; multibillion dollar supply chain; optimization model; semiconductor enterprise manufacturing system; Application software; Computational modeling; Discrete event simulation; Discrete event systems; Manufacturing automation; Manufacturing systems; Predictive control; Predictive models; Semiconductor device manufacture; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference, 2007 Winter
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-1306-5
  • Electronic_ISBN
    978-1-4244-1306-5
  • Type

    conf

  • DOI
    10.1109/WSC.2007.4419796
  • Filename
    4419796