Title :
Computer aided type test system for electric machine
Author :
Dai, Wenjin ; Xu, Longquan ; Zhang, Jingming
Author_Institution :
Dept. of Electr. & Autom. Eng., Nanchang Univ., Jiangxi, China
Abstract :
A microcomputer is adopted as the measure and control center of a computer-aided type test system. This paper introduces the structure and principle of the system and emphasises the untouched temperature testing technology for rotor
Keywords :
automatic test equipment; electric machines; machine testing; microcomputer applications; power engineering computing; rotors; temperature measurement; computer aided type test system; electric machine; microcomputer; rotor; untouched temperature testing technology; Computer interfaces; Control systems; Electric machines; Electric resistance; Instruments; Microcomputers; Printers; Sensor systems; System testing; Temperature sensors;
Conference_Titel :
Power Electronics and Motion Control Conference, 2000. Proceedings. IPEMC 2000. The Third International
Conference_Location :
Beijing
Print_ISBN :
7-80003-464-X
DOI :
10.1109/IPEMC.2000.883080
