Title :
Provocative topics on linear integrated circuits
Author :
Pease, Robert A.
Author_Institution :
Nat. Semicond. Corp., Santa Clara, CA, USA
Abstract :
A discussion is presented of the following topics: relative priorities, check lists, design reviews, design rule checks, digitally computerized simulation, analog computer simulations, breadboards, test strategies, and metal-mask options. These are demonstrated to be valuable for enhancing the probability of good results in high-volume linear integrated circuits (ICs)
Keywords :
circuit analysis computing; integrated circuit technology; integrated circuit testing; linear integrated circuits; analog computer simulations; breadboards; check lists; design reviews; design rule checks; digitally computerized simulation; high volume linear ICs; linear integrated circuits; metal-mask options; relative priorities; test strategies; Analog integrated circuits; Circuit testing; Computer errors; Data engineering; Design engineering; Integrated circuit noise; Job design; Operational amplifiers; Project management; Resists;
Conference_Titel :
Circuits and Systems, 1990., IEEE International Symposium on
Conference_Location :
New Orleans, LA
DOI :
10.1109/ISCAS.1990.112066
