• DocumentCode
    2618546
  • Title

    An External Memory Circuit Validation Algorithm for Large VLSI Layouts

  • Author

    Kumar, Yokesh ; Gupta, Prosenjit

  • Author_Institution
    Int. Inst. of Inf. Technol., Hyderabad
  • fYear
    2007
  • fDate
    9-11 March 2007
  • Firstpage
    510
  • Lastpage
    511
  • Abstract
    The circuit represented by a layout must be validated by comparing it to a schematic circuit to show that the functionality is same as intended. This done by testing for graph isomorphism between the layout and schematic circuit graphs. Circuits designed currently are so large that their corresponding data structures often exceed available main memory and thus, memory hierarchy issues like disk I/Os cannot be ignored. We present an I/O efficient procedure for testing graph isomorphism between circuit graphs. Our approach is based on the global partitioning and local matching phases along with deletion of matched vertices and we give an I/O efficient procedure for each of these phases
  • Keywords
    VLSI; integrated circuit design; integrated circuit layout; integrated memory circuits; isomorphism; memory architecture; circuits design; external memory circuit validation algorithm; global partitioning; graph isomorphism testing; large VLSI layouts; local matching phases; schematic circuit graphs; Algorithm design and analysis; Circuit simulation; Circuit testing; Concatenated codes; Data structures; Design automation; Information technology; Partitioning algorithms; Routing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI, 2007. ISVLSI '07. IEEE Computer Society Annual Symposium on
  • Conference_Location
    Porto Alegre
  • Print_ISBN
    0-7695-2896-1
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2007.24
  • Filename
    4208975