Title :
Impact of Process Variations on Carbon Nanotube Bundle Interconnect for Future FPGA Architectures
Author :
Eachempati, S. ; Vijaykrishnan, N. ; Nieuwoudt, Arthur ; Massoud, Yehia
Author_Institution :
Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., Philadelphia, PA
Abstract :
As CMOS technology continues to scale, copper interconnect (CuI) will hinder the performance and reliability of field programmable gate arrays (FPGA) motivating the need for alternative interconnect solutions for future process technologies. In this paper, we investigate the impact of statistical variations in interconnect properties on FPGA timing yield (TY) when bundles of single-walled carbon nanotubes (SWCNT) are used as interconnect in the FPGA routing fabric. The results indicate that SWCNT bundle-based interconnect (SWCNTBI) can provide a superior performance-yield trade-off over FPGAs implemented using traditional CuI in future process technologies.
Keywords :
CMOS integrated circuits; carbon nanotubes; field programmable gate arrays; integrated circuit design; integrated circuit interconnections; logic design; CMOS technology; FPGA architectures; FPGA routing fabric; FPGA timing yield; carbon nanotube bundle interconnect; copper interconnect; field programmable gate arrays; process variations; single-walled carbon nanotubes; statistical variations; CMOS technology; Carbon nanotubes; Copper; Delay; Fabrics; Field programmable gate arrays; Integrated circuit interconnections; RLC circuits; Routing; Statistical distributions;
Conference_Titel :
VLSI, 2007. ISVLSI '07. IEEE Computer Society Annual Symposium on
Conference_Location :
Porto Alegre
Print_ISBN :
0-7695-2896-1
DOI :
10.1109/ISVLSI.2007.56