Title :
Unit test case generator and automated regression testing in terms of firmware development
Author :
Krunic, Momcilo ; Cetic, Nenad ; Popovic, Miroslav ; Povazan, Ivan
Author_Institution :
RT-RK Inst. for Comput. Based Syst., Novi Sad, Serbia
Abstract :
Regression testing represents a crucial part in the source code development. To avoid laborious and tedious task of writing test cases it could be convenient to develop a test case generator. This paper presents development of such solution using the Eclipse IDE. Beside that, paper describes automatisation of regression testing using the Hudson build server. Generated test suite contains 5282 unit tests that validate libraries functionality, which are integral part of the firmware SDK.
Keywords :
firmware; program testing; software libraries; source code (software); Eclipse IDE; Hudson build server; automated regression testing; firmware SDK; firmware development; libraries functionality; source code development; unit test case generator; Generators; Libraries; Microprogramming; Servers; Silicon; Testing; XML; C; Eclipse; JAXB; Java; Regression testing; XML; build server; python; test case generator;
Conference_Titel :
Telecommunications Forum Telfor (TELFOR), 2014 22nd
Conference_Location :
Belgrade
Print_ISBN :
978-1-4799-6190-0
DOI :
10.1109/TELFOR.2014.7034594
