DocumentCode :
2619449
Title :
A Risk Assessment Framework for analyzing risks associated with a Systems Engineering Process
Author :
Ganguly, Anirban ; Mansouri, Mo ; Nilchiani, Roshanak
Author_Institution :
Sch. of Syst. & Enterprises, Stevens Inst. of Technol., Hoboken, NJ, USA
fYear :
2010
fDate :
5-8 April 2010
Firstpage :
484
Lastpage :
489
Abstract :
Systems Engineering Process (SEP) is the systemic approach to design, development and implementation of a reliable and trustworthy system that satisfies its specified requirements. However, beyond the precision of the plans developed through SEP, it is also essential to consider uncertainties as well as emergent properties created through the process that might lead to negative consequences and subsequent financial losses throughout the system´s life cycle. Therefore, assessing the risks associated with various stages of the SEP is among the key factors in efficiency of engineered systems and one of the major challenges that a systems engineer has to encounter. This paper proposes a Risk Assessment Framework (RAF) for analyzing risks associated with the process of systems engineering. RAF proposes a systemic approach to risk management and analysis through identification, classification, and prioritization of risks associated with different stages of a systems engineering process. The framework is subsequently applied to an illustrative example through which hundreds of subject matter experts participate in the risk evaluation process. Enterprises involved in systems engineering activities can use the findings of this research as a guideline to develop their risk management strategies.
Keywords :
risk analysis; systems engineering; risk analysis; risk assessment framework; risk classification; risk identification; risk prioritization; systems engineering process; Risk Assessment Framework; Risk Identification; Risk Management; Risk Prioritization; Systems Engineering Process;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems Conference, 2010 4th Annual IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-5882-0
Type :
conf
DOI :
10.1109/SYSTEMS.2010.5482460
Filename :
5482460
Link To Document :
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