Study of analog type frequency-temperature characteristics measurement method for activity dips based on DLD jump

This paper describes relationship between activity dips and DLD of crystal resonator. The analog type measurement system of frequency-temperature characteristics for crystal resonator is shown. This measurement system has π-network. The AT-cut crystal resonator for OCXO has activity dips of 1 ppb using this measurement system. Frequency-drive level (crystal current) characteristics of this resonator have the DLD jump. Activity dips relate to the DLD jump. The cause of these activity dips is face shear mode. If radius of plano convex of the crystal resonator is changed, the activity dips and DLD jump disappear