DocumentCode :
2619965
Title :
Temperature effect on a phototransistor used as X-ray beam detector for diagnostic standard radiation qualities
Author :
Santos, Luiz Antonio P. ; Filho, João P Brito
Author_Institution :
Centro Regional de Ciencias Nucleares, Comissão Nacional de Energia Nuclear (CNEN), Recife - PE, CEP 50740-540 Brazil
fYear :
2008
fDate :
19-25 Oct. 2008
Firstpage :
1108
Lastpage :
1109
Abstract :
This work presents some temperature effects on the signal-to-noise ratio of a bipolar phototransistor used as X-ray beam detector for diagnostic standard radiation qualities. The temperature of the phototransistor was varied to evaluate how its dark current can decrease and consequently obtain an improvement in the device response. The results show that in the lower temperature such an effect can reduce signal-to-noise ratio in almost 10 dB for the computed tomography radiation quality.
Keywords :
Cooling; Dark current; IEC standards; Particle beams; Phototransistors; Radiation detectors; Signal to noise ratio; Temperature sensors; X-ray detection; X-ray detectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
Conference_Location :
Dresden, Germany
ISSN :
1095-7863
Print_ISBN :
978-1-4244-2714-7
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2008.4774593
Filename :
4774593
Link To Document :
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