• DocumentCode
    2620171
  • Title

    A model for impact dynamics and its application to frequency analysis of tapping-mode atomic force microscopes

  • Author

    Materassi, D. ; Basso, M. ; Genesio, R.

  • Author_Institution
    Dipt. di Sistemi e Informatica, Firenze Univ., Italy
  • Volume
    6
  • fYear
    2003
  • fDate
    9-12 Dec. 2003
  • Firstpage
    6218
  • Abstract
    The problem of two-body impact dynamics is considered providing a general class of models based on hysteresis functions. The structure of the model and its flexibility allows for a direct application of harmonic balance techniques for the analysis of periodic impacts when the forces involved are repulsive, repulsive-attractive and dissipative. An application to the oscillation analysis of a tapping-mode atomic force microscope (AFM) provides useful analytical results, which give a qualitative explanation of a number of known experimental phenomena.
  • Keywords
    atomic force microscopy; frequency-domain analysis; hysteresis; impact (mechanical); dissipative force; frequency analysis; hysteresis functions; repulsive force; repulsive-attractive force; tapping-mode atomic force microscope; two-body impact dynamics; Atomic force microscopy; Energy loss; Frequency; Harmonic analysis; Hysteresis; Periodic structures; Power system harmonics; Power system modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 2003. Proceedings. 42nd IEEE Conference on
  • ISSN
    0191-2216
  • Print_ISBN
    0-7803-7924-1
  • Type

    conf

  • DOI
    10.1109/CDC.2003.1272277
  • Filename
    1272277