Title :
Current probes, more useful than you think
Author :
Smith, Douglas C.
Author_Institution :
Auspex Syst., Santa Clara, CA, USA
Abstract :
Current probes have been used by EMC engineers for measuring common mode currents to track down EMC problems for many years. Based upon analysis of current probe operation, new uses and ways to extend probe performance are presented. Methods discussed include relative phase measurements, extended low frequency performance, and direct measurement of conductor voltage drop
Keywords :
electric current measurement; electromagnetic compatibility; phase measurement; probes; voltage measurement; EMC; common mode currents measurement; conductor voltage drop measurement; current probe operation; current probes; extended low frequency performance; probe performance extension; relative phase measurements; Coils; Core loss; Current measurement; Equivalent circuits; Filters; Frequency response; Impedance; Inductance; Probes; Voltage;
Conference_Titel :
Electromagnetic Compatibility, 1998. 1998 IEEE International Symposium on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-5015-4
DOI :
10.1109/ISEMC.1998.750102
