Title :
Dependence of current interruption performance on the element patterns of etched fuses
Author :
Ishikawa, Yozo ; Hirose, Keikichi ; Asayama, M. ; Yasushi
Author_Institution :
Saitama Univ. 255 Shimo-Okubo, Saitama
Abstract :
This paper is about fuses for the protection of semiconductors. The pattern of their current-interruption area is composed of chemically etched copper plated on a ceramic substrate. Interruption tests revealed that the l2t characteristics of these fuses are greatly influenced by the numbers P and S of parallel and series interruption points. The l2t value of a 6S-32P fuse is 72 % that of a 6S-8P fuse, and the l2t value of a 24S-8P fuse is 24 % that of a 6S-8P fuse. The synergy of these P and S effects reduces the l2t value of a 24S-32P fuse to only 8.6 % that of a 6S-8P fuse.
Keywords :
electric fuses; semiconductor devices; ceramic substrate; chemically etched copper; current interruption; current-interruption pattern; etched fuse element patterns; interruption tests; semiconductor protection; Ceramics; Chemical elements; Copper; Etching; Fuses; Power control; Power system protection; Semiconductor devices; Substrates; Testing; P effect; S effect; current-interruption; etched fuse;
Conference_Titel :
Electric Fuses and their Applications, 2007. ICEFA 2007. 8th International Conference on
Conference_Location :
Clermont-Ferrand
Print_ISBN :
978-2-84516-363-8
DOI :
10.1109/ICEFA.2007.4419965
