Title :
SYMAN: a symmetry analyzer
Author :
Gross, Ari D. ; Boult, Terrance E.
Author_Institution :
Dept. of Comput. Sci., Columbia Univ., New York, NY, USA
Abstract :
A description is given of the construction of a symmetry analyzer. Examples using SYMAN on both real and synthetic images are shown. SYMAN´s combination of both global and local methods is discussed. The derivation of a global analytic solution for the skew axes when the degree of skew symmetry is known is described. A local tangent-based algorithm which has advantages over previous methods is presented
Keywords :
computerised pattern recognition; computerised picture processing; SYMAN; global analytic solution; local tangent-based algorithm; skew axes; skew symmetry; symmetry analyzer; synthetic images; Computer science; Displays; Equations; Image edge detection; Noise figure; Robustness; Runtime;
Conference_Titel :
Computer Vision and Pattern Recognition, 1991. Proceedings CVPR '91., IEEE Computer Society Conference on
Conference_Location :
Maui, HI
Print_ISBN :
0-8186-2148-6
DOI :
10.1109/CVPR.1991.139810
