Title :
8.8 An 8.2-to-10.3Gb/s full-rate linear reference-less CDR without frequency detector in 0.18μm CMOS
Author :
Sui Huang ; Jun Cao ; Green, Michael M.
Author_Institution :
Univ. of California, Irvine, Irvine, CA, USA
Abstract :
As an alternative to the conventional dual-loop architecture, reference-less CDR architectures have become more popular in industry because of their simplicity and flexibility [1-5]. However, the robustness of the transition between frequency acquisition and phase locking is always a concern, particularly for the linear CDR, which has an extremely limited capture range. Many works, based mainly on the Pottbacker frequency detector (FD) [1], have been reported. In [3] the capture range of the FD is only ±2.4% at 20Gb/s with no capacitor bank in the VCO; in [4] the capture range of the FD is about ±6.4% at 2.75Gb/s, with an 8b resolution of the capacitor bank in the VCO; in [5] the capture range is ±15% at 10Gb/s, with an 11b resolution of the capacitor bank. Thus the Pottbacker FD inherently suffers from a limited capture range, requiring a dedicated FD and a stringent tradeoff between the CDR capture range and the number of VCO bands. In the presence of input jitter and phase-detector (PD) non-idealities, it is difficult to design an architecture where the resolution of the capacitor bank and the turnoff mechanism can guarantee that the VCO frequency will eventually fall within the pull-in range of the CDR.
Keywords :
CMOS integrated circuits; clock and data recovery circuits; phase detectors; voltage-controlled oscillators; CMOS; PD nonidealities; Pottbacker FD; Pottbacker frequency detector; VCO; bit rate 8.2 Gbit/s to 10.3 Gbit/s; capacitor bank; dual-loop architecture; frequency acquisition; input jitter; linear CDR; phase locking; phase-detector; pullin range; referenceless CDR architectures; size 0.18 mum; turnoff mechanism; CMOS integrated circuits; Capacitors; Detectors; Jitter; Partial discharges; Solid state circuits; Voltage-controlled oscillators;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-0918-6
DOI :
10.1109/ISSCC.2014.6757378