DocumentCode :
2621430
Title :
Determining a maximum value yield of a log using an optical log scanner
Author :
Lee, Samuel C. ; Qian, Gen-Sheng ; Chen, Jan-Bon ; Sun, Yi-Wei ; Hay, Douglas A.
Author_Institution :
Oklahoma Univ., Norman, OK, USA
fYear :
1991
fDate :
3-6 Jun 1991
Firstpage :
747
Lastpage :
748
Abstract :
Two pattern recognition algorithms are proposed to detect two types of knots in lumber, lumped and surface knots, using an optical scanner. It is shown that lumped knots can be recognized by a log profile approach and surface knots can be detected by an image processing approach. A mathematical model for describing the geometry of the knots inside the log based on the surface parameters of the knots is presented. By a log breakdown strategy, the log can be cut into a maximum number of boards with prescribed dimensionalities. The mathematical knot model can be used to predict the locations, sizes, orientations, and shapes of the knots on these boards, whereby their lumber grades can be determined. Summing up the value yields of all the boards gives the value yield of the log. By computing all the possible value yields of the log from different log orientations, one can determine a maximum value yield of a log
Keywords :
computerised pattern recognition; computerised picture processing; wood processing; image processing; knots; log breakdown strategy; log profile approach; lumber grades; lumped knots; mathematical knot model; maximum value yield; optical log scanner; pattern recognition algorithms; surface parameters; value yields; Computer vision; Economic forecasting; Electric breakdown; Face detection; Mathematical model; Pattern recognition; Sawing; Shape measurement; Sun; Wood industry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 1991. Proceedings CVPR '91., IEEE Computer Society Conference on
Conference_Location :
Maui, HI
ISSN :
1063-6919
Print_ISBN :
0-8186-2148-6
Type :
conf
DOI :
10.1109/CVPR.1991.139811
Filename :
139811
Link To Document :
بازگشت