Title :
9.4 A 0.5V 1.15mW 0.2mm2 Sub-GHz ZigBee receiver supporting 433/860/915/960MHz ISM bands with zero external components
Author :
Zhicheng Lin ; Pui-In Mak ; Martins, Rui P.
Author_Institution :
Univ. of Macau, Macao, China
Abstract :
The rapid proliferation of Internet of Things has urged the development of ultra-low-power (ULP) radios at the lowest possible cost, while being universal for worldwide markets. Both current-reuse [1,2] and ultra-low-voltage [3] receivers are promising solutions. [1] unifies most RF-to-BB functions in one cell for current-mode signal processing, resulting in a high IIP3 (-6dBm) at small power (2.7mW) and area (0.3mm2). However, outside the current-reuse cell, another supply is required for other circuits, complicating the power management [1,2]. [3] facilitates single-0.3V operation of the entire receiver at 1.6mW for energy harvesting, but the limited voltage headroom and transistor fT call for bulky inductors/transformers to assist the biasing and to tune out the parasitics, penalizing the IIP3 (-21.5dBm) and area (2.5mm2). In both cases, a fixed LC network was adopted for input matching and pre-gain to lower the NF, which is costly and inflexible for multi-band designs.
Keywords :
Internet of Things; Zigbee; energy harvesting; inductors; power transistors; radio receivers; telecommunication power management; transformers; ISM band; Internet of Things; LC network; NF; RF-to-BB function; ULP radio; ZigBee receiver; current-mode signal processing; current-reuse cell; energy harvesting; frequency 433 MHz to 860 MHz; frequency 915 MHz to 960 MHz; high IIP3; inductor-transformer; limited voltage headroom; multiband design; power 1.15 mW; power 1.16 mW; power management; transistor; ultra-low-power radio; ultra-low-voltage receiver; voltage 0.5 V; zero external component; Filtering; Impedance matching; Mixers; Noise measurement; Radio frequency; Receivers; Voltage-controlled oscillators;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-0918-6
DOI :
10.1109/ISSCC.2014.6757383