Title :
A CMOS high-speed front-end for cluster counting techniques in ionization detectors
Author :
Baschirotto, A. ; Amico, S.D. ; De Matteis, M. ; Grancagnolo, F. ; Panareo, M. ; Perrino, R. ; Chiodini, G. ; Tassielli, G.
Author_Institution :
Salento Univ., Salerno
Abstract :
The counting of the consecutive ionization clusters in a drift chamber is a very promising technique for particle identification purposes. Although this technique features a number of advantages, the bottleneck for its implementation is represented by the difficulties in realizing a low cost, high-speed electronic interface. In fact, typical time separation between each ionization act in a helium-based gas mixture is from a few ns to a few tens of ns. Thus the read-out interface has to be able to process such a high-speed signals. It will be demonstrated that a read-out channel composed of a fast, large bandwidth preamplifier and of a large conversion rate Analog-to-Digital converter fullfil all the requirements for cluster counting. The recent scaled CMOS integrated circuit technologies allows to realize such a low-cost high-speed front-end, opening the possibility of realizing efficient cluster-counter-based detectors. In this paper, a CMOS 0.13 mum integrated readout circuit, including a fast preamplifier (with a -3B bandwidth of 500 MHz) and lGS/s-6bit ADC is designed for the central tracker of a future collider (ILC, super-B). The performance and the design issues associated to this architecture are discussed.
Keywords :
CMOS integrated circuits; preamplifiers; readout electronics; CMOS high-speed front-end; CMOS integrated circuit; cluster counting techniques; drift chamber; fast preamplifier; ionization detectors; readout circuit; Analog-digital conversion; Bandwidth; CMOS integrated circuits; CMOS technology; Costs; Detectors; High-speed electronics; Ionization; Preamplifiers; Signal processing;
Conference_Titel :
Advances in Sensors and Interface, 2007. IWASI 2007. 2nd International Workshop on
Conference_Location :
Bari
Print_ISBN :
978-1-4244-1245-7
Electronic_ISBN :
978-1-4244-1245-7
DOI :
10.1109/IWASI.2007.4420027