Title :
Analysis of error and time behavior of the IEEE 802.15.4 phy-layer in an industrial environment
Author :
Vedral, Andreas ; Wollert, Jorg F.
Keywords :
Bit error rate; Communication industry; Error analysis; Interleaved codes; Manufacturing industries; Measurement standards; Performance analysis; Semiconductor device manufacture; Testing; Transceivers;
Conference_Titel :
Factory Communication Systems, 2006 IEEE International Workshop on
Conference_Location :
Torino, Italy
Print_ISBN :
1-4244-0379-0
DOI :
10.1109/WFCS.2006.1704138
