Title :
10.5 A 90nm 20MHz fully nonvolatile microcontroller for standby-power-critical applications
Author :
Sakimura, Noboru ; Tsuji, Yukihide ; Nebashi, Ryusuke ; Honjo, Hiroaki ; Morioka, Ayuka ; Ishihara, Koichi ; Kinoshita, Keizo ; Fukami, Shunsuke ; Miura, Shun ; Kasai, Naoki ; Endoh, Tetsuo ; Ohno, Hideo ; Hanyu, Takahiro ; Sugibayashi, Tadahiko
Author_Institution :
NEC, Tsukuba, Japan
Abstract :
Recently there has been increased demand for not only ultra-low power, but also high performance, even in standby-power-critical applications. Sensor nodes, for example, need a microcontroller unit (MCU) that has the ability to process signals and compress data immediately. A previously reported 130nm CMOS and FeRAM-based MCU features zero-standby power and fast wakeup operation by incorporating FeRAM devices into logic circuits [1]. The 8MHz speed, however, was not sufficiently high to meet application requirements, and the FeRAM process also has drawbacks: low compatibility with standard CMOS, and write endurance limitations. A spintronics-based nonvolatile integrated circuit is a promising option to achieve zero standby power and high-speed operation, along with compatibility with CMOS processes. In this work, we demonstrate a fully nonvolatile 16b MCU using 90nm standard CMOS and three-terminal SpinRAM technology. It achieves 20MHz, 145μW/MHz operation with a 1V supply in the active state, and 4.5μW intermittent operation with 120ns wakeup time and 0.1% active ratio, without forwarding of re-boot code from memory. The features provide sufficiently long battery life to achieve maintenance-free sensor nodes.
Keywords :
CMOS integrated circuits; low-power electronics; magnetoelectronics; microcontrollers; random-access storage; CMOS processes; FeRAM devices; FeRAM-based MCU; frequency 20 MHz; logic circuits; microcontroller unit; power 4.5 muW; sensor nodes; size 90 nm; spintronics-based nonvolatile integrated circuit; standby-power-critical applications; three-terminal SpinRAM technology; time 120 ns; voltage 1 V; word length 16 bit; write endurance limitations; zero standby power; Clocks; Microcontrollers; Nonvolatile memory; Random access memory; Registers; Software; Switches;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-0918-6
DOI :
10.1109/ISSCC.2014.6757392