DocumentCode
2621821
Title
Testability modeling and analysis based on rough set
Author
Su, Xuejun ; Wang, Chenggang ; Cai, Shichuang
Author_Institution
Dept. of Basic Exp., Naval Aeronaut. & Astronaut. Univ., Yantai, China
fYear
2011
fDate
27-29 June 2011
Firstpage
2653
Lastpage
2656
Abstract
Aiming at the limitation of dependency model in description and analysis of uncertain problem for testability analysis of complex circuit board, a testability modeling and analysis method is put forward based on fault simulation and rough set. Firstly, an information system is generated through fault simulation. Then, decision table matrix is provided by conditional attributes discretization and reduction. And moreover, the fault detection rate and fault isolation rate of circuit board can be calculated based on the matrix. Finally, an example proves that our method is feasible and effective.
Keywords
analogue circuits; data reduction; design for testability; fault location; fault simulation; integrated circuit testing; matrix algebra; printed circuit testing; rough set theory; attributes reduction; complex circuit board; conditional attributes discretization; fault detection rate; fault isolation rate; fault simulation; information system; matrix; rough set theory; testability analysis; testability modeling; Analog circuits; Analytical models; Circuit faults; Information systems; Integrated circuit modeling; Printed circuits; Transmission line matrix methods; fault simulation; rough set; testability analysis; testability modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Science and Service System (CSSS), 2011 International Conference on
Conference_Location
Nanjing
Print_ISBN
978-1-4244-9762-1
Type
conf
DOI
10.1109/CSSS.2011.5974752
Filename
5974752
Link To Document