• DocumentCode
    2621821
  • Title

    Testability modeling and analysis based on rough set

  • Author

    Su, Xuejun ; Wang, Chenggang ; Cai, Shichuang

  • Author_Institution
    Dept. of Basic Exp., Naval Aeronaut. & Astronaut. Univ., Yantai, China
  • fYear
    2011
  • fDate
    27-29 June 2011
  • Firstpage
    2653
  • Lastpage
    2656
  • Abstract
    Aiming at the limitation of dependency model in description and analysis of uncertain problem for testability analysis of complex circuit board, a testability modeling and analysis method is put forward based on fault simulation and rough set. Firstly, an information system is generated through fault simulation. Then, decision table matrix is provided by conditional attributes discretization and reduction. And moreover, the fault detection rate and fault isolation rate of circuit board can be calculated based on the matrix. Finally, an example proves that our method is feasible and effective.
  • Keywords
    analogue circuits; data reduction; design for testability; fault location; fault simulation; integrated circuit testing; matrix algebra; printed circuit testing; rough set theory; attributes reduction; complex circuit board; conditional attributes discretization; fault detection rate; fault isolation rate; fault simulation; information system; matrix; rough set theory; testability analysis; testability modeling; Analog circuits; Analytical models; Circuit faults; Information systems; Integrated circuit modeling; Printed circuits; Transmission line matrix methods; fault simulation; rough set; testability analysis; testability modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Service System (CSSS), 2011 International Conference on
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4244-9762-1
  • Type

    conf

  • DOI
    10.1109/CSSS.2011.5974752
  • Filename
    5974752