• DocumentCode
    2621866
  • Title

    Performance analysis of coexistence between LTE-TDD and TD-SCDMA

  • Author

    Jia, Hui ; Miao, Qingyu ; Yin, Changchuan ; Wu, Huarui ; Ma, Yan

  • Author_Institution
    Lab. of Wireless Commun. Syst. & Networks, Beijing Univ. of Posts & Telecommun., Beijing, China
  • fYear
    2009
  • fDate
    16-18 Oct. 2009
  • Firstpage
    303
  • Lastpage
    307
  • Abstract
    In the progress of standardization of 3GPP Long Term Evolution (LTE), it is of the most importance to ensure the coexistence between LTE system and other systems. This paper is aiming at presenting a clear is deployed co-existed with TD-SCDMA system, which has been deployed in China. Monte Carlo simulation is used to get the statistic results. The two systems are assumed to have similar uplink and downlink ratio, i.e., there is no BS-to-BS interference. Adjacent channel interference power ratio (ACIR) model and interference model, which are the focuses of this paper, are modified to accommodate to the coexistence of TD-SCDMA and LTE-TDD systems. Capacity loss and throughput loss as the performance indicators are discussed in detail with three different system offsets. What´s more, some useful conclusions on the coexistence of LTE-TDD and TDSCDMA systems are presented.
  • Keywords
    3G mobile communication; Monte Carlo methods; adjacent channel interference; code division multiple access; time division multiplexing; 3GPP long term evolution; BS-to-BS interference; LTE system; LTE-TDD; Monte Carlo simulation; TD-SCDMA system; adjacent channel interference power ratio model; capacity loss; throughput loss; time division duplexing; Downlink; Interchannel interference; Long Term Evolution; Performance analysis; Performance loss; Power system modeling; Standardization; Statistics; Throughput; Time division synchronous code division multiple access; ACIR; LTE-TDD; TD-SCDMA; interference; performance loss;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications Technology and Applications, 2009. ICCTA '09. IEEE International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-4816-6
  • Electronic_ISBN
    978-1-4244-4817-3
  • Type

    conf

  • DOI
    10.1109/ICCOMTA.2009.5349188
  • Filename
    5349188