Title :
Growth of gallium antimonide (GaSb) by metalorganic chemical vapour deposition
Author :
Subekti, Agus ; Goldys, E.M. ; Tansley, Trevor L.
Author_Institution :
Semicond. Sci. & Technol. Lab., Macquarie Univ., Sydney, NSW, Australia
Abstract :
Growth of unintentionally doped GaSb by atmospheric pressure MOCVD using Trimethylgallium (TMGa) and Trimethylantimonide (TMSb) on various substrate is investigated. Optimum growth temperature and the V/III ratio window is given with respect to hole density, mobility and optical properties. The optimum growth rate was found to be 2.2 μm/h with good surface morphology for samples grown at 500-540°C and V/III ratio approximately equal to unity. The as grown samples are p-type, having room-temperature mobility and hole density at the optimum growth condition as above, of 500 cm2 V-1 s-1 and 0.5-3.0×1017 cm-3, respectively. The fundamental absorption band edge of grown layers in transmission spectra shows clear excitonic features at low temperatures. Very short growth time leads to quantum dot formation with the best quantum dots grown on Ge
Keywords :
III-V semiconductors; chemical vapour deposition; gallium compounds; hole density; hole mobility; infrared spectra; semiconductor growth; semiconductor quantum dots; semiconductor thin films; 500 to 540 C; GaSb; absorption band edge; exciton; gallium antimonide; growth; hole density; hole mobility; metalorganic chemical vapour deposition; optical properties; quantum dot; surface morphology; transmission spectrum; Chemical vapor deposition; Gallium arsenide; Gallium compounds; Optical microscopy; Optical surface waves; Quantum dots; Rough surfaces; Substrates; Surface morphology; Temperature distribution;
Conference_Titel :
Optoelectronic and Microelectronic Materials And Devices Proceedings, 1996 Conference on
Conference_Location :
Canberra, ACT
Print_ISBN :
0-7803-3374-8
DOI :
10.1109/COMMAD.1996.610157