Title :
Facial feature location using multilayer perceptrons and micro-features
Author_Institution :
BT Labs., Ipswich, UK
Abstract :
An approach to robust feature location in images that treats the feature sought as a collection of micro-features is discussed. The spatial responses of multilayer perceptrons trained on micro-features are interpreted as probability distributions conditional on the image data. A postprocessor uses this information, together with prior information on the spatial relationships between micro-features, to choose the location of the feature that maximizes the a posteriori probability that the feature is at the given location. The method is demonstrated for the problem of locating the eyes in head-and-shoulders images, where it is shown to produce significantly better results than the use of a single detector trained to recognize the feature as a whole
Keywords :
neural nets; pattern recognition; picture processing; probability; facial feature location; micro-features; multilayer perceptrons; neural nets; pattern recognition; probability; spatial relationships; Computer vision; Detectors; Eyes; Face recognition; Facial features; Head; Multilayer perceptrons; Pixel; Robustness; Testing;
Conference_Titel :
Neural Networks, 1991. 1991 IEEE International Joint Conference on
Print_ISBN :
0-7803-0227-3
DOI :
10.1109/IJCNN.1991.170418