Title :
Concern Based Approach to Generating SCR Requirement Specification: A Case Study
Author :
Jin, Ying ; Zhang, Jing ; Hao, Weiping ; Ma, Pengfei
Author_Institution :
Coll. of Comput. Sci. & Technol., Jilin Univ., Changchun, China
fDate :
March 31 2009-April 2 2009
Abstract :
SCR is a mature and widely used document driven requirement method, which emphasizes creating strict and complete formal requirement documents during software requirement analysis to serve the whole life circle. However, due to the big gap between textual requirement description and formal requirement document, how to obtain formal SCR requirements specification from informal textual description becomes an obstacle of applying SCR to real projects. In this paper, a concern based approach to generating SCR requirement specification from textual requirement document is proposed. The requirement analysis process includes concerns elicitation, specification of concerns and their relationship, identification of concepts, definition and classification of variables, derivation of SCR requirement specification, and validation of requirement specification. The method introduced in this paper has been applied to a classical case - light control system by documenting the requirements of hallway section. It is indicated that our approach bridges the gap between textual requirement description and formal SCR requirement document.
Keywords :
formal specification; formal verification; SCR requirement specification; concept identification; concern based approach; concerns elicitation; concerns specification; formal requirement document; hallway section; light control system; requirement specification validation; software life circle; software requirement analysis; textual requirement description; variable classification; variable definition; Bridges; Computer science; Control systems; Documentation; Educational institutions; Large-scale systems; Lighting control; Mathematics; Software engineering; Thyristors; 4-variable model; SCR requirement specificaion; concern relationship graph;
Conference_Titel :
Computer Science and Information Engineering, 2009 WRI World Congress on
Conference_Location :
Los Angeles, CA
Print_ISBN :
978-0-7695-3507-4
DOI :
10.1109/CSIE.2009.1000