Title :
ESD-induced Voltages In Horizontally And Vertically Mounted Printed Circuit Boards
Author :
Okayasu, R. ; Takagi, K.
Author_Institution :
NTT Telecommunication Networks Laboratories
Keywords :
Circuit testing; Coupling circuits; Electrostatic discharge; IEC standards; Independent component analysis; Intelligent networks; Laboratories; Performance evaluation; Printed circuits; Voltage;
Conference_Titel :
Consumer Electronics, 1993. Digest of Technical Papers. ICCE., IEEE 1993 International Conference on
Conference_Location :
Rosemont, IL, USA
Print_ISBN :
0-7803-0843-3
DOI :
10.1109/ICCE.1993.697651