DocumentCode :
2622598
Title :
Waveguide Perturbation Techniques In Microwave Semi-Conductor Diagnostics
Author :
Champlin, K.S. ; Armstrong, D.B.
Volume :
62
Issue :
1
fYear :
1961
fDate :
15-17 May 1961
Firstpage :
99
Lastpage :
106
Abstract :
DC transport properties (e. g. , conductivity, Hall effect, magneto-conductivity) are proportional to various averages of the electron-lattice relaxation time ( <T> , <T/sup 2/> , <T/sup 3/> , etc.) and hence give indirect information about the scattering mechanisms affecting the conduction process. With microwaves, the observation frequency can frequently be of the order of the scattering frequency 1/(2/spl pi <T> ). Under these conditions, microwave transport properties are complex and contain potentially more information concerning detailed scattering mechanisms than the analogous dc properties.
Keywords :
Acoustic scattering; Conductivity; Frequency; Hall effect; Magnetic analysis; Mechanical factors; Microwave theory and techniques; Perturbation methods; Semiconductor waveguides; Tensile stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
PGMTT National Symposium Digest
Conference_Location :
Washington, DC, USA
Type :
conf
DOI :
10.1109/PGMTT.1962.1122395
Filename :
1122395
Link To Document :
بازگشت