Title :
Damage to magnetic recording heads due to electromagnetic interference
Author :
Wallash, Albert ; Smith, Doug
Author_Institution :
Quantum Corp., Milpitas, CA, USA
Abstract :
The effect of electromagnetic interference (EMI) on giant magnetoresistive (GMR) recording heads is studied for the first time. It is shown that a GMR head connected to test equipment can be physically and/or magnetically damaged by a remote ESD event or other spark that causes radiated EMI. SEM failure analysis shows severe melting of the thin film GMR sensor. It is concluded that it is important to understand, measure and prevent EMI damage to GMR recording heads, and that EMI testing has revealed a new and important failure mechanism for magnetic recording sensors
Keywords :
electric sensing devices; electromagnetic interference; electrostatic discharge; failure analysis; magnetic heads; magnetoresistive devices; scanning electron microscopy; sparks; thin film devices; EMI; EMI damage measurement; EMI damage prevention; SEM failure analysis; electromagnetic interference; failure mechanism; magnetic recording heads damage; magnetic recording sensors; magnetoresistive recording heads; radiated EMI; remote ESD event; spark; test equipment; thin film GMR sensor; Electromagnetic interference; Electromagnetic radiation; Failure analysis; Giant magnetoresistance; Magnetic devices; Magnetic heads; Magnetic recording; Magnetic sensors; Test equipment; Thin film sensors;
Conference_Titel :
Electromagnetic Compatibility, 1998. 1998 IEEE International Symposium on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-5015-4
DOI :
10.1109/ISEMC.1998.750315
