DocumentCode
2622960
Title
[Title page i]
fYear
2009
fDate
25-29 May 2009
Abstract
The following topics are dealt with: ADC testing; test pattern generation; post-silicon validation; functional self-testing of CMT processors; concurrent self-testing; integrated circuit testing; random sequential test generation; SoC reliability characterisation; alternate RF testing; signature-based testing; minimal diagnostic test set generation; digital circuit testing; test encoding; secret information protection; delay testing.
Keywords
automatic test pattern generation; circuit testing; digital integrated circuits; integrated circuit testing; ADC testing; CMT processors; SoC reliability; alternate RF testing; concurrent self-testing; delay testing; digital circuit testing; functional self-testing; integrated circuit testing; minimal diagnostic test set generation; post-silicon validation; random sequential test generation; secret information protection; signature-based testing; test encoding; test pattern generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2009 14th IEEE European
Conference_Location
Seville
Print_ISBN
978-0-7695-3703-0
Type
conf
DOI
10.1109/ETS.2009.1
Filename
5170440
Link To Document