Title :
Design and test issues of a FPGA based data acquisition system for medical imaging using PEM
Author :
Leong, C. ; Bento, P. ; Rodrigues, P. ; Silva, J.C. ; Trindade, A. ; Lousã, P. ; Rego, J. ; Nobre, J. ; Varela, J. ; Teixeira, J.P. ; Teixeira, I.C.
Author_Institution :
Prosys Lab, INESC-ID, Lisboa
Abstract :
The main aspects of the design and test (D&T) of a reconfigurable architecture for the data acquisition electronics (DAE) system of the clear-PEM detector are presented in this paper. The application focuses medical imaging using a compact PEM (positron emission mammography) detector with 12288 channels, targeting high sensitivity and spatial resolution. The DAE system processes data that comes from a front-end (FE) electronics that identifies the relevant data and transfers it to a PC for image processing. The design is supported in a novel D&T methodology, in which hierarchy, modularity and parallelism are extensively exploited to improve design and testability features. Parameterization has also been used to improve design flexibility. Nominal frequency is 100 MHz. The DAE must respond to a data acquisition rate of 1 million relevant events (coincidences) per second, under a total single photon background rate in the detector of 10 MHz. Trigger and data acquisition logic is implemented in eight 4-million, one 2-million and one 1-million gate FPGAs (Xilinx Virtex II). Functional built-in self test (BIST) and debug features are incorporated in the design to allow on-board FPGA testing and self-testing during product lifetime
Keywords :
biomedical imaging; built-in self test; data acquisition; field programmable gate arrays; mammography; positron emission tomography; reconfigurable architectures; 100 MHz; BIST; FPGA based data acquisition system; Xilinx Virtex II; clear-PEM detector; data acquisition logic; debug features; functional built-in self test; medical imaging; on-board FPGA testing; positron emission mammography; reconfigurable architecture design; reconfigurable architecture testing; trigger logic; Automatic testing; Biomedical imaging; Built-in self-test; Data acquisition; Detectors; Electronic equipment testing; Field programmable gate arrays; Life testing; Medical tests; System testing;
Conference_Titel :
Real Time Conference, 2005. 14th IEEE-NPSS
Conference_Location :
Stockholm
Print_ISBN :
0-7803-9183-7
DOI :
10.1109/RTC.2005.1547481
