Title :
Polarization interferometry measurement of the Pockels coefficient in a chiral Bi/sub 12/SiO/sub 20/ single crystal
Author :
Han, S.H. ; Wu, J.W.
Author_Institution :
Dept. of Phys., Ewha Womens Univ., Seoul, South Korea
Abstract :
Single beam polarization interferometry was introduced to measure the Pockels coefficients in a BSO single crystal. The linear superposition principle of the induced birefringence and the optical activity was employed in the analysis of the Pockels effect measurement.
Keywords :
Pockels effect; bismuth compounds; chirality; light interferometry; light polarisation; optical rotation; photorefractive materials; BSO single crystal; Bi/sub 12/SiO/sub 20/; Pockels coefficient; Pockels effect measurement; chiral Bi/sub 12/SiO/sub 2/O single crystal; induced birefringence; linear superposition principle; optical activity; polarization interferometry measurement; single beam polarization interferometry; Birefringence; Bismuth; Holographic optical components; Holography; Nonlinear optics; Optical interferometry; Optical modulation; Optical polarization; Optical refraction; Optical variables control;
Conference_Titel :
Nonlinear Optics: Materials, Fundamentals, and Applications, 2000. Technical Digest
Conference_Location :
Kaua´i-Lihue, HI, USA
Print_ISBN :
1-55752-646-X
DOI :
10.1109/NLO.2000.883582
