DocumentCode :
2623263
Title :
Algorithms for ADC Multi-site Test with Digital Input Stimulus
Author :
Sheng, Xiaoqin ; Kerkhoff, Hans ; Zjajo, Amir ; Gronthoud, Guido
Author_Institution :
Dept. of EEMCS, Univ. of Twente, Enschede, Netherlands
fYear :
2009
fDate :
25-29 May 2009
Firstpage :
45
Lastpage :
50
Abstract :
This paper reports two novel algorithms based on time-modulo reconstruction method intended for detection of the parametric faults in analogue-to-digital converters (ADC). In both algorithms, a pulse signal, in its slightly adapted form to allow sufficient time for converter settling, is taken as the test stimulus reliving the burden placed on accuracy requirement of excitation source. The objective of the test scheme is not to completely replace traditional specification-based tests, but to provide a reliable method for early identification of excessive parameter variations in production test that allows quickly discarding of most of the faulty circuits before going through the conventional test. The efficiency of the methods is validated on a 6-bit flash ADC.
Keywords :
analogue-digital conversion; signal reconstruction; 6-bit flash ADC; ADC multisite test; analogue-to-digital converters; converter settling; digital input stimulus; excessive parameter variations; excitation source; parametric faults; pulse signal; reliable method; time-modulo reconstruction method; traditional specification-based tests; CMOS technology; Circuit faults; Circuit testing; Fault detection; Harmonic distortion; Linearity; Power harmonic filters; Production; Pulse width modulation; Semiconductor device testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2009 14th IEEE European
Conference_Location :
Seville
Print_ISBN :
978-0-7695-3703-0
Type :
conf
DOI :
10.1109/ETS.2009.17
Filename :
5170458
Link To Document :
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