Title :
The applications of fuzzy comprehensive evaluation to test programs analysis
Author :
Ma, Yuhai ; Sun, Yihe ; Chen, Hongyi
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing, China
Abstract :
This paper presents an approach to support analysis and debugging of VLSI device test programs. In research into the previous work, we find that there are two restrictions in program debugging: computational complexity and diagnostic precision, which greatly influence the effect of program debugging. In the paper, we apply Fuzzy Mathematics, especially Fuzzy Comprehensive Evaluation, to research on fuzzy knowledge representation, fuzzy relation, and fuzzy inference, etc. in the test programs analysis. An algorithm for the selection of the test entities to be debugged is addressed
Keywords :
VLSI; computational complexity; fuzzy set theory; integrated circuit testing; knowledge representation; program debugging; VLSI device test programs; computational complexity; diagnostic precision; fuzzy comprehensive evaluation; fuzzy inference; fuzzy knowledge representation; fuzzy mathematics; fuzzy relation; program debugging; test programs analysis; Algorithms; Computational complexity; Debugging; Fuzzy set theory; Fuzzy systems; Humans; Mathematical model; Mathematics; System testing; Very large scale integration;
Conference_Titel :
Fuzzy Information Processing Society, 1997. NAFIPS '97., 1997 Annual Meeting of the North American
Conference_Location :
Syracuse, NY
Print_ISBN :
0-7803-4078-7
DOI :
10.1109/NAFIPS.1997.624075
