DocumentCode :
2623389
Title :
Automated Nanomanipulation with Atomic Force Microscopes
Author :
Mokaberi, Babak ; Yun, Jaehong ; Wang, Michael ; Requicha, Aristides A.G.
Author_Institution :
Lab. for Molecular Robotics, Southern California Univ., Los Angeles, CA
fYear :
2007
fDate :
10-14 April 2007
Firstpage :
1406
Lastpage :
1412
Abstract :
Automation has long been recognized as an important goal in AFM (atomic force microscope) nanomanipulation research. For the precise manipulation of small particles with sizes on the order of 10 nm, however, automation has remained an elusive goal, primarily because of the spatial uncertainties associated with the positioning mechanisms of the AFM and with the manipulation process itself. Extensive user intervention has been necessary for the construction of desired nanostructures with the AFM, resulting in very low throughput, and severely limiting the complexity of structures that could be built with a reasonable amount of time and labor. This paper describes a fully automatic system for building arbitrary planar patterns of nanoparticles by AFM manipulation. Given an initial, random distribution of particles on a substrate surface and a desired pattern to be formed with them, a planner determines the paths required to perform the manipulation operations. The output of the planner is a sequence of primitive commands for positioning and pushing operations involving motion along line segments. The primitive commands are executed through software that compensates for thermal drift, creep and hysteresis. Experimental results presented here show that the system can build in minutes a pattern that normally would take an experienced user a whole day to construct interactively.
Keywords :
atomic force microscopy; control engineering computing; creep; hysteresis; micromanipulators; motion control; nanotechnology; physics computing; 10 nm; AFM manipulation; atomic force microscopes; automated nanomanipulation; creep; hysteresis; nanoparticles; positioning mechanisms; thermal drift; Assembly; Atomic force microscopy; Creep; Feedback; Hysteresis; Nanobioscience; Nanoparticles; Throughput; Uncertainty; Voltage; AFMs; Atomic Force Microscopes; automatic nanomanipulation; creep; drift; hysteresis; nanorobotics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Robotics and Automation, 2007 IEEE International Conference on
Conference_Location :
Roma
ISSN :
1050-4729
Print_ISBN :
1-4244-0601-3
Electronic_ISBN :
1050-4729
Type :
conf
DOI :
10.1109/ROBOT.2007.363181
Filename :
4209285
Link To Document :
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