Title :
Defect Filter for Alternate RF Test
Author :
Stratigopoulos, Haralampos-G ; Mir, Salvador ; Acar, Erkan ; Ozev, Sule
Author_Institution :
TIMA Lab., CNRS-INP Grenoble-UJF, Grenoble, France
Abstract :
Alternate RF testing is a very promising candidate for replacing the costly standard specification-based approach. The defect filter in the alternate test flow is a crucial preparatory step for the overall success of alternate test. In this paper, we present a novel nonlinear defect filter based on an estimate of the joint probability density function of the alternate measurements. The construction of the filter does not require a defect dictionary and can accommodate any underlying density without needing any prior knowledge regarding its parametric form.
Keywords :
circuit testing; nonlinear filters; radiofrequency filters; RF testing; nonlinear defect filter; radiofrequency testing; specification-based approach; Data mining; Density measurement; Dictionaries; Filtering; Filters; Laboratories; Principal component analysis; Probability density function; Radio frequency; Testing; RF test; alternate test; defect filter; density estimation;
Conference_Titel :
Test Symposium, 2009 14th IEEE European
Conference_Location :
Seville
Print_ISBN :
978-0-7695-3703-0
DOI :
10.1109/ETS.2009.32
