• DocumentCode
    2623399
  • Title

    Defect Filter for Alternate RF Test

  • Author

    Stratigopoulos, Haralampos-G ; Mir, Salvador ; Acar, Erkan ; Ozev, Sule

  • Author_Institution
    TIMA Lab., CNRS-INP Grenoble-UJF, Grenoble, France
  • fYear
    2009
  • fDate
    25-29 May 2009
  • Firstpage
    101
  • Lastpage
    106
  • Abstract
    Alternate RF testing is a very promising candidate for replacing the costly standard specification-based approach. The defect filter in the alternate test flow is a crucial preparatory step for the overall success of alternate test. In this paper, we present a novel nonlinear defect filter based on an estimate of the joint probability density function of the alternate measurements. The construction of the filter does not require a defect dictionary and can accommodate any underlying density without needing any prior knowledge regarding its parametric form.
  • Keywords
    circuit testing; nonlinear filters; radiofrequency filters; RF testing; nonlinear defect filter; radiofrequency testing; specification-based approach; Data mining; Density measurement; Dictionaries; Filtering; Filters; Laboratories; Principal component analysis; Probability density function; Radio frequency; Testing; RF test; alternate test; defect filter; density estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2009 14th IEEE European
  • Conference_Location
    Seville
  • Print_ISBN
    978-0-7695-3703-0
  • Type

    conf

  • DOI
    10.1109/ETS.2009.32
  • Filename
    5170466