Title :
18.6 2.5D heterogeneously integrated bio-sensing microsystem for multi-channel neural-sensing applications
Author :
Po-Tsang Huang ; Lei-Chun Chou ; Teng-Chieh Huang ; Shang-Lin Wu ; Tang-Shuan Wang ; Yu-Rou Lin ; Chuan-An Cheng ; Wen-Wei Shen ; Kuan-Neng Chen ; Jin-Chern Chiou ; Ching-Te Chuang ; Wei Hwang ; Kuo-Hua Chen ; Chi-Tsung Chiu ; Ming-Hsiang Cheng ; Yueh-Lun
Author_Institution :
Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
Heterogeneously integrated and miniaturized neural sensing microsystems for accurately capturing and classifying signals are crucial for brain function investigation and neural prostheses realization [1]. Many neural sensing microsystems have been proposed to provide small form-factor and biocompatible properties, including stacked multichip [2, 3], microsystem with separated neural sensors [4], monolithic packaged microsystem [5] and through-silicon-via (TSV) based double-side integrated microsystem [6]. These heterogeneous biomedical devices are composed of sensors and CMOS circuits for biopotential acquisition, signal processing and transmission. However, the weak signals detected from sensors in [2-5] have to pass through a string of interconnections to the CMOS circuits by wire bonding. In view of this, TSV-based double-side integration [6] uses TSV arrays to transfer the weak signals from μ-probe arrays to CMOS circuits for reducing noises. Nevertheless, the double-side integration requires preserving large area for separate μ-probe arrays and TSV arrays, and the TSV fabrication process may induce damage on CMOS circuits.
Keywords :
CMOS integrated circuits; bioelectric potentials; brain; lead bonding; prosthetics; three-dimensional integrated circuits; 2.5D heterogeneously integrated biosensing microsystem; CMOS circuits; biopotential acquisition; brain function investigation; double side integrated microsystem; form factor; monolithic packaged microsystem; multichannel neural sensing; neural prostheses realization; noise reduction; signal capture; signal classification; through-silicon-via; wire bonding; Array signal processing; CMOS integrated circuits; Clocks; Discrete wavelet transforms; Educational institutions; Sensors; Through-silicon vias;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-0918-6
DOI :
10.1109/ISSCC.2014.6757452