DocumentCode :
262371
Title :
19.5 Three-dimensional 128Gb MLC vertical NAND Flash-memory with 24-WL stacked layers and 50MB/s high-speed programming
Author :
Ki-Tae Park ; Jin-Man Han ; Daehan Kim ; Sangwan Nam ; Kihwan Choi ; Min-Su Kim ; Pansuk Kwak ; Doosub Lee ; Yoon-He Choi ; Kyung-Min Kang ; Myung-Hoon Choi ; Dong-Hun Kwak ; Hyun-Wook Park ; Sang-Won Shim ; Hyun-Jun Yoon ; Doohyun Kim ; Sang-Won Park ; K
Author_Institution :
Samsung Semicond., Hwasung, South Korea
fYear :
2014
fDate :
9-13 Feb. 2014
Firstpage :
334
Lastpage :
335
Abstract :
In the past few years, various 3D NAND Flash memories have been demonstrated, from device feasibility to chip implementation, to overcome scaling challenges in conventional planar NAND Flash [1-3]. The difficulties include shrinking the NAND cell and increasing manufacturing costs due to quadruple patterning and extreme ultraviolet lithography, motivating the development of the next-generation node beyond 16nm-class NAND Flash [4]. In this paper, as a new 3D memory device with lower manufacturing cost and superior device scalability, we present a true 3D 128Gb 2b/cell vertical-NAND (V-NAND) Flash. The chip accomplishes 50MB/s write throughput with 3K endurance for typical embedded applications such as mobile and personal computer. Also, extended endurance of 35K is achieved with 33MB/s of write throughput for data center and enterprise SSD applications.
Keywords :
NAND circuits; flash memories; three-dimensional integrated circuits; 24-WL stacked layers; 3D 128Gb 2b/cell vertical-NAND Flash; 3D memory device; 3K endurance; bit rate 50 Mbit/s; data center; embedded applications; enterprise SSD applications; high-speed programming; mobile applications; personal computer; storage capacity 128 Gbit; three-dimensional MLC vertical NAND flash-memory; write throughput; Arrays; Couplings; Flash memories; Microprocessors; Three-dimensional displays; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0193-6530
Print_ISBN :
978-1-4799-0918-6
Type :
conf
DOI :
10.1109/ISSCC.2014.6757458
Filename :
6757458
Link To Document :
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