Modeling and characterization of integrated passive elements for applications in silicon high frequency systems

Author

Caverly, Robert H. ; Walsh, Timothy ; Reifsnyder, James ; Pearson, Sean

Author_Institution

Dept. of Electr. & Comput. Eng., Villanova Univ., PA, USA

fYear

2004

fDate

8-10 Sept. 2004

Firstpage

215

Lastpage

218

Abstract

A methodology for robust integrated circuit passive element modeling has been developed. The methodology was used to design process-independent structures in a silicon CMOS process and combined a number of techniques and software packages to ensure run-to-run stability of element values. Experimental data verifying the techniques is presented.

Keywords

CMOS integrated circuits; HF amplifiers; MOS integrated circuits; capacitors; inductors; integrated circuit modelling; passive networks; silicon; software packages; MOSFET; amplifier; capacitor; element values; inductor; integrated passive elements; passive element modeling; process-independent structures; robust integrated circuit; run-to-run stability; silicon CMOS process; silicon high frequency systems; software packages; Application software; CMOS process; Circuit stability; Frequency; Integrated circuit modeling; Process design; Robustness; Semiconductor device modeling; Silicon; Software packages;

fLanguage

English

Publisher

ieee

Conference_Titel

Silicon Monolithic Integrated Circuits in RF Systems, 2004. Digest of Papers. 2004 Topical Meeting on

Print_ISBN

0-7803-8703-1

Type

conf

DOI

10.1109/SMIC.2004.1398206

Filename

1398206