DocumentCode
2624131
Title
Analytical model for high level power modeling of combinational and sequential circuits
Author
Gupta, Subodh ; Najm, Farid N.
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
fYear
1999
fDate
4-5 Mar 1999
Firstpage
164
Lastpage
172
Abstract
In this paper, we propose a modeling approach that captures the dependence of the power dissipation of a (combinational or sequential) logic circuit on its input/output signal switching statistics. The resulting power macromodel, consists of a quadratic or cubic equation in four variables, that can be used to estimate the power consumed in the circuit for any given input/output signal statistics. Given a low-level (typically gate-level) description of the circuit, we describe a characterization process that uses a recursive least squares (RLS) algorithm by which such a equation-based model can be automatically built. The four variables of our model are the average input signal probability, average input switching activity, average input spatial correlation coefficient and average output zero-delay switching activity. This approach has been implemented and models have been built and tested for many combinational and sequential benchmark circuits
Keywords
circuit analysis computing; combinational circuits; convergence of numerical methods; integrated circuit modelling; integrated logic circuits; least squares approximations; low-power electronics; probability; sequential circuits; RLS algorithm; analytical model; average input signal probability; average input spatial correlation coefficient; average input switching activity; average output zero-delay switching activity; characterization process; combinational circuits; cubic equation; equation-based model; gate-level description; high level power modeling; input/output signal switching statistics; low-level description; power dissipation dependence; power macromodel; quadratic equation; recursive least squares algorithm; sequential circuits; Analytical models; Circuit testing; Equations; Least squares methods; Logic circuits; Power dissipation; Probability; Resonance light scattering; Statistics; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Low-Power Design, 1999. Proceedings. IEEE Alessandro Volta Memorial Workshop on
Conference_Location
Como
Print_ISBN
0-7695-0019-6
Type
conf
DOI
10.1109/LPD.1999.750417
Filename
750417
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