Title :
Nonlinear properties of ion-implanted photonic crystals
Author :
Ajgaonkar, M. ; Zhang, Ye ; Grebel, Haim ; Brown, Rebecca ; Jacobson, David ; White, C.W.
Author_Institution :
Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ, USA
Abstract :
Nonlinear refraction coefficients were measured for an ordered array of silica nanoclusters implanted with ions of Ge, Si and Er. Efficient nonlinear optical elements, as thin as the propagating wavelength, may now become a reality.
Keywords :
erbium; germanium; ion implantation; molecular clusters; nanostructured materials; nonlinear optics; optical arrays; optical elements; optical materials; photonic band gap; refractive index; silicon; silicon compounds; Er; Ge; Si; SiO/sub 2/; SiO/sub 2/:Er; SiO/sub 2/:Ge; SiO/sub 2/:Si; efficient nonlinear optical elements; ion-implanted photonic crystals; nonlinear properties; nonlinear refraction coefficients; ordered array; propagating wavelength; silica nanoclusters; Annealing; Crystalline materials; Erbium; Nonlinear optics; Optical arrays; Optical films; Optical refraction; Particle beam optics; Photonic crystals; Silicon compounds;
Conference_Titel :
Nonlinear Optics: Materials, Fundamentals, and Applications, 2000. Technical Digest
Conference_Location :
Kaua´i-Lihue, HI, USA
Print_ISBN :
1-55752-646-X
DOI :
10.1109/NLO.2000.883666
