DocumentCode :
2625285
Title :
Thickness Dependence Of Tunneling Magnetoresistance Effect In Granular Fe-Al/sub 2/O/sub 3/ Films
Author :
Huang, Y.H. ; Hsu, J.H. ; Chen, J.W.
Author_Institution :
Dept. of Physics, National Taiwan University
fYear :
1997
fDate :
1-4 April 1997
Keywords :
Conductivity; Electrons; Insulation; Iron; Physics; Semiconductor films; Sputtering; Substrates; Temperature dependence; Tunneling magnetoresistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
Type :
conf
DOI :
10.1109/INTMAG.1997.597495
Filename :
597495
Link To Document :
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