Title :
Time-adaptive pattern recognition and prediction for situational robustness
Author :
Kil, David H. ; Shin, Frances B.
Author_Institution :
Adv. Concepts & Dev., Lockheed Martin-AZ, Goodyear, AZ, USA
Abstract :
In automatic target recognition (ATR) and time-series prediction, we use a training or historical database to tune the parameters of a classifier, which then operates on unknown data. In general, statistical properties in terms of class-conditional probability density functions are assumed to be similar between training and test data. Unfortunately, in many real-world applications, this assumption is violated, leading to erratic or even poor ATR performance. In this paper, we explore several methodologies to overcome this problem. We assess the efficacy of two algorithms with real data to demonstrate the importance of simple, intuitive solutions in dealing with difficult situations
Keywords :
Gaussian distribution; adaptive estimation; adaptive signal detection; adaptive signal processing; array signal processing; computational complexity; data compression; deconvolution; feature extraction; learning (artificial intelligence); log normal distribution; military computing; neural nets; object recognition; parameter estimation; pattern classification; prediction theory; radar imaging; radar signal processing; radar target recognition; sensor fusion; target tracking; adaptive beamforming; adaptive clustering probabilistic neural net; algorithms efficacy; at-sea performance; automatic target recognition; class-conditional probability density functions; classification; data mismatch; feature compression; feature extraction; historical database; log-likelihood ratio; model mismatch errors; multipronged attack strategy; multisensor fusion; multivariate Gaussian classifier; parameter esimation; real-world applications; simple intuitive solutions; situational robustness; time-adaptive pattern recognition; time-series prediction; tracking; training database; Array signal processing; Clustering algorithms; Databases; Laboratories; Pattern recognition; Probability density function; Robustness; Target recognition; Testing; Training data;
Conference_Titel :
OCEANS '97. MTS/IEEE Conference Proceedings
Conference_Location :
Halifax, NS
Print_ISBN :
0-7803-4108-2
DOI :
10.1109/OCEANS.1997.624090